Methods & Techniques
I
employ Transmission Electron Microscopy (TEM), high resolution TEM
(HRTEM), and quantitative HRTEM.
For quantitative structural studies, I use techniques such as
geometrical phase analysis and
peak finding. Such methods are particularly useful for determination of
the elastoplastic behaviour of materials at the nanoscale in combintion
with anisotropic elasticity calculations. I combine the experimental
analyses with image simulations for
arriving at the exact structural and chemical models.I am an expert on
interfacial crystallography
and topological defect analysis and characterization, performing a
priori prediction of admissible defects, as well as a
posteriori characterization from HRTEM observations. I have applied
these
approaches to numerous case studies of interfacial structures and
materials
systems. In addition, I have worked on methods of TEM specimen
preparation that
are suitable for the quantitative analysis of complex nanostructured
heterostructures in semiconductor epilayers
and devices.
Research Topics
- homophase
and heterophase interfaces in crystalline materials, thin films
- line and extended defects
- nanostructured
heterostructures (e.g. quantum wells, quantum dots, nanowires,
nanocolumns),
- strain
fields and compositional variations at the nanoscale
- nanoscale
defect interactions and elasto-plastic behaviour
Materials
- Compound
semiconductor heterostructures and nanostructures, particularly
III-Nitrides
- 2D layered materials and graphene
- Plasmonic nano-heterostructures
- Hexagonal metals
- Ordered
alloys
- Polycrystalline
materials
- Industrial wastes
Research projects
a.
Scientist in charge
- Interfaces of advanced III-Nitride
semiconductors without polarization fields
- Experimental and Theoretical
Investigation of Phase Transformations during Vitrification and
Re-crystallization of Glasses containing Toxic Solid Wastes
b.
Scientist in charge of collaborating
research
group
- High Efficiency III-Nitride
Semiconductor
Photovoltaic Devices.
- Mechanical and structural properties
at the nanoscale of semiconducting films for opto- and microelectronic
applications.
- Elimination of structural defects in
nitride semiconductor layers (InGaN and InAlGaN) used as active layers
in
semiconductor lasers
c. Participating
Scientist
- Plastic deformation of hexagonal metals
- Advanced
Materials Processing and
Materials Structure and Properties
- Interfaces
of Advanced Materials
- Fabrication
of advanced materials from
powders under high temperature and pressure conditions
- Management
of lead-containing solid
wastes for lead recycling and residue re-use in the building sector
- Physics
and technology of GaN FETs
- Management
of toxic residues in fuel
tanks
- Semiconductor
optoelectronic devices
in the UV range
- Characterization
and properties of
novel ΙΙΙ-V semiconductor
heterostructures-nanostructures
- Technological
management of industrial
solid wastes for the production of inert products
- Morphogenesis
of deformation and
self-organization of structural defects in the macro/meso/micro and
nano-scales: Bridging scales for applications in nanomechanics and
nanothechnology
- Growth
and study of silicon thin films
for the fabrication of high efficiency microelectronics devices on
large
surfaces
- Mechanics
of simulated toxic waste systems
- Νanophotonic
semiconductor devices
- Interface
Science at the Atomic Level
- High Resolution Electron Microscopy and Computer Modeling
- Experimental
and Theoretical Investigation of Interfaces between Crystals of
Hexagonal Symmetry
- Interface
Analysis at
Atomic Level and Properties of Advanced Materials
- Interfacial
phenomena at atomic
resolution and multiscale properties of novel III-V semiconductors
- Multi-functional
thin film coatings based on
nano-structured metallic glasses and composites for space applications
- Chemical
and biochemical sensors based on III-nitride quantum dots as
optical transducers
- Growth
and characterization of self-organized
pore networks in InGaP/GaAs heterostructures
- Application
of the finite element analysis and
molecular dynamics methods on the study of structural defects and
interfaces of
nanostructured materials
- III-V
semiconductor
heterostructures / nanostructures towards innovative electronic and
photonic
applications
Supervisions of Ph.D. Theses
-
Α. Lotsari,
Title: Interfaces and
Defects of advanced ΙΙΙ-Ν
heterostructures-nanostructures without
polarization fields (2014)
- C. Bazioti,
Title: Strutural defects and interfaces of heteroepitaxial thin films
(continuing since 2013)
- Τ. Κoukoula, Title: Structural
properties and phenomena in
low-dimensional semiconductor systems (2015) - Member of supervizing
committee
- Μ. Soumelidou, Title: Study of
structures
and structural defects by electron microscopy methods (continuing since
2010) - Member of supervizing committee
- Ν. Florini, Title: Structure
and properties of nanosized compound semiconductors (continuing since
2013) - Member of supervizing committee